Troubleshooting on Microprocessor Based Systems by G. B. Williams, D. W. Hopkins

By G. B. Williams, D. W. Hopkins

The constitution of a computing method provides special difficulties whilst it fails to function competently and calls for trying out. This concise, but accomplished e-book describes the key attempt equipment in present use, and their improvement from simple ideas. Examines the series of assessments which, equipped on one another, offer an appropriate motor vehicle for trying out electronic structures, and some of the sorts of checking out gear that are meant to be utilized for particular assessments. a great creation for these coming into this more and more advanced international, the textual content will give you the reader with a company foundation on which to pass judgement on destiny improvement

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The first benefit to the user is a reduction in hard errors where opcode values are wrongly entered. If, for example, the mnemonic UDD was incorrectly entered, then error checking routines within the assembler package would detect it and flag an error message to the operator. Mnemonic codes such as ADD, SUB, AND and MOV are commonly used to indicate the type of operation to be carried out. Programs written in assembler form have a one-to-one correspon­ dence with machine code instructions and are thus as efficient as them.

The free-run test provides a simple method of testing some of the major components of a microprocessor based system and can be applied to any type of device. The free-run mode of operation also plays a part in a testing technique called Signature Analysis which is discussed in Chapter 7. 6 CPU TESTING Although one of the most complex, the microprocessor is one of the least likely devices to fail in a system. As we have already seen, any complex LSI device such as a microprocessor cannot be fully tested which forces manufacturers to only functionally test the devices.

Tests can be applied to indicate any "address related" problems in a system by initially writing OO to all RAM locations and then writing FF to the first RAM location only. Every other location within the device is then checked for OO. If the test is successful, the first location is cleared to OO and FF written into the second location only and all other locations again tested for OO. If a location other than that set to FF gives a result other than OO, then an "address related" fault is assumed either in the device or on the external address bus lines.

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